Nalezeno 25 záznamů (23 v impaktovaných časopisech, 2 ve WOS sbornících).
Vypsat níže uvedené ve WoS (* NOVINKA *) — nefunguje pro počet záznamů > 100.
Vypsat níže uvedené ve Scopus (* NOVINKA *)
(BibTeX & \bibitem všech článků tohoto člověka)
Burian, T; Chalupský, J; Hájková, V; Toufarová, M; Vorlíček, V; Hau-Riege, S; Krzywinski, J; Bozek, JD; Bostedt, C; Graf, AT; Jastrow, UF; Kreis, S; London, RA; Messerschmidt, M; Moeller, S; Sobierajski, R; Tiedtke, K; de Grazia, M; Auguste, T; Carré, B; Guizard, S; Merdji, H; Medvedev, N; Juha, L
Subthreshold Erosion of an Organic Polymer Induced by Multiple Shots of an X-Ray Free-Electron Laser
Phys. Rev. Applied, 14 (3): Art. No. 034057 (14 pages), 2020.
doi:10.1103/PhysRevApplied.14.034057 (odkaz na abstrakt) - PDF ISI ID:000575421300002 - BibTeX & \bibitem
Wild, J; Pira, P; Burian, T; Vysin, L; Juha, L; Zelinger, Z; Danis, S; Nehasil, V; Rafaj, Z; Nevrly, V; Dostal, M; Bitala, P; Kudrna, P; Tichy, M; Rocca, JJ
Ablation of single-crystalline cesium iodide by extreme ultraviolet capillary-discharge laser
Nukleonika, 65 (4): 205–210, 2020.
doi:10.2478/nuka-2020-0031 (odkaz na abstrakt) - PDF ISI ID:000582490100001 - BibTeX & \bibitem
Vyšín, L; Burian, T; Ukraintsev, E; Davídková, M; Grisham, ME; Heinbuch, S; Rocca, JJ; Juha, L
Dose-Rate Effects in Breaking DNA Strands by Short Pulses of Extreme Ultraviolet Radiation
Radiation Research, 189 (5): 466–476, 2018.
doi:10.1667/RR14825.1 (odkaz na abstrakt) - PDF ISI ID:000430572800003 - BibTeX & \bibitem
Vozda, V; Burian, T; Chalupský, J; Dědič, V; Hájková, V; Hlídek, P; Juha, L; Kozlová, M; Krůs, M; Kunc, J; Rejhon, M; Vyšín, L; Rocca, JJ; Franc, J
Micro-Raman mapping of surface changes induced by XUV laser radiation in cadmium telluride
J. Alloy. Compd., 763: 662–669, 2018.
doi:10.1016/j.jallcom.2018.05.332 (odkaz na abstrakt) - PDF ISI ID:000442484300076 - BibTeX & \bibitem
van den Berg, Q Y; Fernandez-Tello, E V; Burian, T; Chalupský, J; Chung, H-K; Ciricosta, O; Dakovski, G L; Hájková, V; Hollebon, P; Juha, L; Krzywinski, J; Lee, R W; Minitti, M P; Preston, T R; de la Varga, A G; Vozda, V; Zastrau, U; Wark, J S; Velarde, P; Vinko, S M
Clocking Femtosecond Collisional Dynamics via Resonant X-Ray Spectroscopy
Phys. Rev. Lett., 120 (5): Art. No. 055002 (6 pages), 2018.
doi:10.1103/PhysRevLett.120.055002 (odkaz na abstrakt) - PDF ISI ID:000423991600010 - BibTeX & \bibitem
Krása, J; Klír, D; Řezáč, K; Cikhardt, J; Krůs, M; Velyhan, A; Pfeifer, M; Buryšková, S; Dostál, J; Burian, T; Dudžák, R; Turek, K; Pisarczyk, T; Kalinowska, Z; Chodukowski, T; Kaufman, J
Production of relativistic electrons, MeV deuterons and protons by sub-nanosecond terawatt laser
Phys. Plasmas, 25 (11): Art. No. 113112 (10 pages), 2018.
doi:10.1063/1.5052146 (odkaz na abstrakt) - PDF ISI ID:000451734600043 - BibTeX & \bibitem
Milov, I; Makhotkin, IA; Sobierajski, R; Medvedev, N; Lipp, V; Chalupský, J; Sturm, JM; Tiedtke, K; de Vries, G; Störmer, M; Siewert, F; van de Kruijs, R; Louis, E; Jacyna, I; Jurek, M; Juha, L; Hájková, V; Vozda, V; Burian, T; Saksl, K; Faatz, B; Keitel, B; Plönjes, E; Schreiber, S; Toleikis, S; Loch, R; Hermann, M; Strobel, S; Nienhuys, H-K; Gwalt, G; Mey, T; Enkisch, H; Bijkerk, F
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser
Opt. Express, 26 (15): Art. No. 19665 (21 pages), 2018.
doi:10.1364/OE.26.019665 (odkaz na abstrakt) - PDF ISI ID:000439472400076 - BibTeX & \bibitem
Makhotkin, IA; Milov, I; Chalupský, J; Tiedtke, K; Enkisch, H; de Vries, G; Scholze, F; Siewert, F; Sturm, JM; Nikolaev, KV; van de Kruijs, RWE; Smithers, MA; van Wolferen, HAGM; Keim, EG; Louis, E; Jacyna, I; Jurek, M; Klinger, D; Pelka, JB; Juha, L; Hájková, V; Vozda, V; Burian, T; Saksl, K; Faatz, B; Keitel, B; Plönjes, E; Schreiber, S; Toleikis, S; Loch, R; Hermann, M; Strobel, S; Donker, R; Mey, T; Sobierajski, R
Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold
J. Opt. Soc. Am. B, 35 (11): Art. No. 2799 (7 pages), 2018.
doi:10.1364/JOSAB.35.002799 (odkaz na abstrakt) - PDF ISI ID:000448941700021 - BibTeX & \bibitem
Toufarová, M; Hájková, V; Chalupský, J; Burian, T; Vacík, J; Vorlíček, V; Vyšín, L; Gaudin, J; Medvedev, N; Ziaja, B; Nagasono, M; Yabashi, M; Sobierajski, R; Krzywinski, J; Sinn, H; Störmer, M; Koláček, K; Tiedtke, K; Toleikis, S; Juha, L
Contrasting behavior of covalent and molecular carbon allotropes exposed to extreme ultraviolet and soft x-ray free-electron laser radiation
Phys. Rev. B, 96 (21): Art. No. 214101 (11 pages), 2017.
doi:10.1103/PhysRevB.96.214101 (odkaz na abstrakt) - PDF ISI ID:000416941500001 - BibTeX & \bibitem
Krzywinski, J; Andrejczuk, A; Bionta, RM; Burian, T; Chalupský, J; Jurek, M; Kirm, M; Nagirnyi, V; Sobierajski, R; Tiedtke, K; Vielhauer, S; Juha, L
Saturation of a Ce:Y3Al5O12 scintillator response to ultra-short pulses of extreme ultraviolet soft X-ray and X-ray laser radiation
Opt. Mater. Express, 7 (3): 665–675, 2017.
doi:10.1364/OME.7.000665 (odkaz na abstrakt) - PDF ISI ID:000395672700002 - BibTeX & \bibitem
Cho, BI; Cho, MS; Kim, M; Chung, H-K; Barbrel, B; Engelhorn, K; Burian, T; Chalupský, J; Ciricosta, O; Dakovski, GL; Hájková, V; Holmes, M; Juha, L; Krzywinski, J; Lee, RW; Nam, CH; Rackstraw, DS; Toleikis, S; Turner, JJ; Vinko, SM; Wark, JS; Zastrau, J; Heimann, PA
Observation of Reverse Saturable Absorption of an X-ray Laser
Phys. Rev. Lett., 119 (7): Art. No. 075002 (5 pages), 2017.
doi:10.1103/PhysRevLett.119.075002 (odkaz na abstrakt) - PDF ISI ID:000407719400005 - BibTeX & \bibitem
Preston, TR; Vinko, SM; Ciricosta, O; Hollebon, P; Chung, H-K; Dakovski, GL; Krzywinski, J; Minitti, M; Burian, T; Chalupský, J; Hájková, V; Juha, L; Vozda, V; Zastrau, U; Lee, RW; Wark, JS
Measurements of the K-Shell Opacity of a Solid-Density Magnesium Plasma Heated by an X-Ray Free-Electron Laser
Phys. Rev. Lett., 119 (8): Art. No. 085001 (5 pages), 2017.
doi:10.1103/PhysRevLett.119.085001 (odkaz na abstrakt) - PDF ISI ID:000408354800009 - BibTeX & \bibitem
Ciricosta, O; Vinko, SM; Barbrel, B; Rackstraw, DS; Preston, TR; Burian, T; Chalupský, J; Cho, BI; Chung, H-K; Dakovski, GL; Engelhorn, K; Hájková, V; Heimann, P; Holmes, M; Juha, L; Krzywinski, J; Lee, RW; Toleikis, S; Turner, JJ; Zastrau, U; Wark, JS
Measurements of continuum lowering in solid-density plasmas created from elements and compounds
Nat. Commun., 7 (May): Art. No. 11713 (6 pages), 2016.
doi:10.1038/ncomms11713 (odkaz na abstrakt) - PDF ISI ID:000376206100001 - BibTeX & \bibitem
Sobierajski, R; Jacyna, I; Dłużewski, P; Klepka, MT; Klinger, D; Pełka, JB; Burian, T; Hájková, V; Juha, L; Saksl, K; Vozda, V; Makhotkin, I; Louis, E; Faatz, B; Tiedtke, K; Toleikis, S; Enkisch, H; Hermann, M; Strobel, S; Loch, RA; Chalupsky, J
Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 MHz repetition rate
Opt. Express, 24 (14): 15468–15477, 2016.
doi:10.1364/OE.24.015468 (odkaz na abstrakt) - PDF ISI ID:000381770500043 - BibTeX & \bibitem
Burian, T; Hajkova, V; Chalupsky, J; Vysin, L; Bohacek, P; Precek, M; Wild, J; Ozkan, C; Coppola, N; Farahani, SD; Schulz, J; Sinn, H; Tschentscher, T; Gaudin, J; Bajt, S; Tiedtke, K; Toleikis, S; Chapman, HN; Loch, RA; Jurek, M; Sobierajski, R; Krzywinski, J; Moeller, S; Harmand, M; Galasso, G; Nagasono, M; Saskl, K; Sovak, P; Juha, L
Soft x-ray free-electron laser induced damage to inorganic scintillators
Opt. Mater. Express, 50 (2): 254–264, 2015.
doi:10.1364/OME.5.000254 (odkaz na abstrakt) - PDF ISI ID:000350664100005 - BibTeX & \bibitem
Pira, P; Burian, T; Kolpakova, A; Tichy, M; Kudrna, P; Danis, S; Juha, L; Lancok, J; Vysin, L; Civis, S; Zelinger, Z; Kubat, P; Wild, J
Langmuir probe measurement of the bismuth plasma plume formed by an extreme-ultraviolet pulsed laser
J. Phys. D-Appl. Phys., 47 (40): Art. No. 405205 (6 pages), 2014.
doi:10.1088/0022-3727/47/40/405205 (odkaz na abstrakt) - PDF ISI ID:000341784800012 - BibTeX & \bibitem
Rackstraw, DS; Vinko, SM; Ciricosta, O; Cho, BI; Engelhorn, K; Chung, H-K; Brown, CRD; Burian, T; Chalupsky, J; Falcone, RW; Graves, C; Hajkova, V; Higginbotham, A; Juha, L; Krzywinski, J; Lee, HJ; Messerschmidt, M; Murphy, C; Ping, Y; Scherz, A; Schlotter, W; Toleikis, S; Turner, JJ; Vysin, L; Wang, T; Wu, B; Zastrau, U; Zhu, D; Nagler, B; Lee, RW; Heimann, PA; Wark, JS
Opacity effects in a solid-density aluminium plasma created by photo-excitation with an X-ray laser
High Energy Density Phys., 11 (Jun): 59–69, 2014.
doi:10.1016/j.hedp.2014.02.003 (odkaz na abstrakt) - PDF ISI ID:000338616500008 - BibTeX & \bibitem
Chalupsky, J; Burian, T; Hajkova, V; Juha, L; Polcar, T; Gaudin, J; Nagasono, M; Sobierajski, R; Yabashi, M; Krzywinski, J
Fluence scan: an unexplored property of a laser beam
Opt. Express, 21 (22): 26363–26375, 2013.
doi:10.1364/OE.21.026363 (odkaz na abstrakt) - PDF ISI ID:000327007800094 - BibTeX & \bibitem
Renner, O; Smid, M; Burian, T; Juha, L; Krasa, J; Krousky, E; Matulkova, I; Skala, J; Velyhan, A; Liska, R; Velechovsky, J; Pisarczyk, T; Chodukowski, T; Larroche, O; Ullschmied, J
Environmental conditions in near-wall plasmas generated by impact of energetic particle fluxes
High Energy Density Phys., 9 (3): 568–572, 2013.
doi:10.1016/j.hedp.2013.05.012 (odkaz na abstrakt) ISI ID:000323855100031 - BibTeX & \bibitem
Gaudin, J; Medvedev, N; Chalupsky, J; Burian, T; Dastjani-Farahani, S; Hajkova, V; Harmand, M; Jeschke, HO; Juha, L; Jurek, M; Klinger, D; Krzywinski, J; Loch, RA; Moeller, S; Nagasono, M; Ozkan, C; Saksl, K; Sinn, H; Sobierajski, R; Sovak, P; Toleikis, S; Tiedtke, K; Toufarova, M; Tschentscher, T; Vorlicek, V; Vysin, L; Wabnitz, H; Ziaja, B
Photon energy dependence of graphitization threshold for diamond irradiated with an intense XUV FEL pulse
Phys. Rev. B, 88 (6): Art. No. 060101 (4 pages), 2013.
doi:10.1103/PhysRevB.88.060101 (odkaz na abstrakt) ISI ID:000322812700001 - BibTeX & \bibitem
Sobierajski, R; Jurek, M; Chalupsky, J; Krzywinski, J; Burian, T; Farahani, SD; Hajkova, V; Harmand, M; Juha, L; Klinger, D; Loch, RA; Ozkan, C; Pelka, JB; Sokolowski-Tinten, K; Sinn, H; Toleikis, S; Tiedtke, K; Tschentscher, T; Wabnitz, H; Gaudin, J
Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids
J. Instrum., 8: Art. No. P02010 (15 pages), 2013.
doi:10.1088/1748-0221/8/02/P02010 (odkaz na abstrakt) ISI ID:000315672700066 - BibTeX & \bibitem
Wierzchowski, W; Wieteska, K; Klinger, D; Sobierajski, R; Pelka, JB; Zymierska, D; Balcer, T; Chalupsky, J; Gaudin, J; Hajkova, V; Burian, T; Gleeson, AJ; Juha, L; Sinn, H; Sobota, D; Tiedtke, K; Toleikis, S; Tschentscher, T; Vysin, L; Wabnitz, H; Paulmann, C
Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
Radiat. Phys. Chem., 93: 99–103, 2013.
doi:10.1016/j.radphyschem.2013.04.025 (odkaz na abstrakt) - PDF ISI ID:000326910900019 - BibTeX & \bibitem
Nevrly, V; Janku, J; Dlabka, J; Vasinek, M; Juha, L; Vysin, L; Burian, T; Lancok, J; Skrinsky, J; Zelinger, Z; Pira, P; Wild, J
Global sensitivity analysis of the XUV-ABLATOR code
Proc. SPIE, 8777: Art. No. 87770C (8 pages), 2013.
doi:10.1117/12.2017542 (odkaz na abstrakt) - PDF ISI ID:000329577700009
Cho, BI; Engelhorn, K; Vinko, SM; Chung, H-K; Ciricosta, O; Rackstraw, DS; Falcone, RW; Brown, CRD; Burian, T; Chalupsky, J; Graves, C; Hajkova, V; Higginbotham, A; Juha, L; Krzywinski, J; Lee, HJ; Messersmidt, M; Murphy, C; Ping, Y; Rohringer, N; Scherz, A; Schlotter, W; Toleikis, S; Turner, JJ; Vysin, L; Wang, T; Wu, B; Zastrau, U; Zhu, D; Lee, RW; Nagler, B; Wark, JS; Heimann, PA
Resonant Kα Spectroscopy of Solid-Density Aluminum Plasmas
Phys. Rev. Lett., 109 (24): Art. No. 245003 (6 pages), 2012.
doi:10.1103/PhysRevLett.109.245003 (odkaz na abstrakt) - PDF ISI ID:000312068300021 - BibTeX & \bibitem
Pira, P; Burian, T; Vysin, L; Chalupsky, J; Lancok, J; Wild, J; Strizik, M; Zelinger, Z; Rocca, JJ; Juha, L
Ablation of ionic crystals induced by capillary-discharge XUV laser
Proc. SPIE, 8077: Art. No. 807719 (7 pages), 2011.
doi:10.1117/12.890406 (odkaz na abstrakt) - PDF ISI ID:000293212000030
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