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BibTeX entries:

@ARTICLE{Makhotkin:18:Damage,
	 author = {Makhotkin, I.A. AND Milov, I. AND Chalupský, J. AND Tiedtke, K. AND Enkisch, H. AND de Vries, G. AND Scholze, F. AND Siewert, F. AND Sturm, J.M. AND Nikolaev, K.V. AND van de Kruijs, R.W.E. AND Smithers, M.A. AND van Wolferen, H.A.G.M. AND Keim, E.G. AND Louis, E. AND Jacyna, I. AND Jurek, M. AND Klinger, D. AND Pelka, J.B. AND Juha, L. AND Hájková, V. AND Vozda, V. AND Burian, T. AND Saksl, K. AND Faatz, B. AND Keitel, B. AND Plönjes, E. AND Schreiber, S. AND Toleikis, S. AND Loch, R. AND Hermann, M. AND Strobel, S. AND Donker, R. AND Mey, T. AND Sobierajski, R.},
	 title = {Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold},
	 journal = {J. Opt. Soc. Am. B},
	 fulljournal = {Journal of the Optical Society of America B},
	 volume = {35},
	 number = {11},
	 pages = {2799},
	 eid = {2799},
	 year = {2018},
	 issn = {0740-3224,1520-8540},
	 doi = {10.1364/JOSAB.35.002799},
	 KFPPid = {1921},
}

Bibitems:

\bibitem[{Makhotkin et~al.(2018)}]{Makhotkin:18:Damage}
Makhotkin, I.A., Milov, I., Chalupský, J., Tiedtke, K., Enkisch, H., de Vries, G., Scholze, F., Siewert, F., Sturm, J.M., Nikolaev, K.V., van de Kruijs, R.W.E., Smithers, M.A., van Wolferen, H.A.G.M., Keim, E.G., Louis, E., Jacyna, I., Jurek, M., Klinger, D., Pelka, J.B., Juha, L., Hájková, V., Vozda, V., Burian, T., Saksl, K., Faatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Donker, R., Mey, T., Sobierajski, R., Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold. {\it J. Opt. Soc. Am. B.} {\bf 35}(11): 2799, 2018.