Martin Setvin (Associate Professor)


Research interests

Noncontact Atomic force microscopy (nc-AFM): Recent developments in this experimental technique offer intriguing opportunities in materials research, i.e., molecular and submolecular resolution, enhanced capabilities of chemical identification, or measurement and control of the charge state of species adsorbed at surfaces. These capabilities provide a new angle of view on complex materials, which were often difficult to approach by other experimental methods. My main aim is currently developing the methodology for understanding the surfaces of binary and ternary oxides, and pointing out the opportunities offered by the nc-AFM technique.

Selected recent publications