About the system
High-resolution photoelectron spectroscopy system for quantitative surface chemical analysis and chemical-state identification. The instrument is used both as a stand-alone analysis platform and in support of thin-film, oxide and model-catalyst studies.
Experimental methods
- XPS: elemental and chemical-state analysis of the outermost surface layers
- Angle-resolved XPS: depth- and geometry-sensitive photoelectron measurements
Further equipment & capabilities
- PREVAC EA15 hemispherical electron analyser with 150 mm mean radius
- RMC50 monochromated dual-anode Al/Ag X-ray source
- Selectable transmission and angular lens modes
- Two-dimensional MCP/phosphor detection
Typical research topics
- Surface chemistry of oxides and thin films
- Chemical-state analysis
- Model catalysts and electrocatalysts
- Interface and overlayer characterization