About the system
The RHEED–XPS platform is designed for controlled preparation and structural/chemical analysis of ultrathin films, clusters and model materials. Diffraction, energy-loss spectroscopy and XPS can be combined with in-situ deposition and gas exposure.
Experimental methods
- RHEED: reflection high-energy electron diffraction for surface and thin-film structure
- RHEELS: reflection high-energy electron energy-loss spectroscopy
- XPS: X-ray photoelectron spectroscopy for surface composition and chemical states
Further equipment & capabilities
- Dual-beam Tectra evaporation source and individual metal/oxide evaporators
- Oxford Applied Research thermal gas cracker
- Quadrupole mass spectrometer and gas inlet for adsorption and catalytic experiments
- SPECS ion gun for sample cleaning
- Rapid sample exchange and sample parking
- Oxygen-plasma treatment for controlled oxidation
Typical research topics
- Metal clusters on tungsten, cobalt and cerium oxide supports
- Bimetallic systems and intermetallic alloys on oxide surfaces
- Preparation and structure of ultrathin WOx layers
- Functional layers for biological and gas-sensing applications