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UT=000460496100020 OR UT=000502687500032 OR UT=000405023400007


BibTeX entries:
@ARTICLE{Doležal:19:Charge,
	 author = {Doležal, J. AND Merino, P. AND Redondo, J. AND Ondič, L. AND Cahlík, A. AND Švec, M.},
	 title = {Charge Carrier Injection Electroluminescence with CO-Functionalized Tips on Single Molecular Emitters},
	 journal = {Nano Lett.},
	 fulljournal = {Nano Letters},
	 volume = {19},
	 number = {12},
	 pages = {8605--8611},
	 year = {2019},
	 issn = {1530-6984,1530-6992},
	 doi = {10.1021/acs.nanolett.9b03180},
	 KFPPid = {2043},
}

@ARTICLE{Lüpke:19:Surface,
	 author = {Lüpke, F. AND Doležal, J. AND Cherepanov, V. AND Ošťádal, I. AND Stefan Tautz, F. AND Voigtländer, B.},
	 title = {Surface structures of tellurium on Si(111)–(7×7) studied by low-energy electron diffraction and scanning tunneling microscopy},
	 journal = {Surf. Sci.},
	 fulljournal = {SURFACE SCIENCE},
	 volume = {681},
	 number = {Mar},
	 pages = {130--133},
	 year = {2019},
	 issn = {0039-6028},
	 doi = {10.1016/j.susc.2018.11.016},
	 KFPPid = {1945},
}

@ARTICLE{Lüpke:17:Chalcogenide-based,
	 author = {Lüpke, F. AND Just, S. AND Bihlmayer, G. AND Lanius, M. AND Luysberg, M. AND Doležal, J. AND Neumann, E. AND Cherepanov, V. AND Ošťádal, I. AND Mussler, G. AND Grützmacher, D. AND Voigtländer, B.},
	 title = {Chalcogenide-based van der Waals epitaxy: Interface conductivity of tellurium on Si(111)},
	 journal = {Phys. Rev. B},
	 fulljournal = {PHYSICAL REVIEW B},
	 volume = {96},
	 number = {3},
	 pages = {035301},
	 eid = {035301},
	 year = {2017},
	 issn = {1098-0121},
	 doi = {10.1103/PhysRevB.96.035301},
	 KFPPid = {1735},
}


Bibitems:

\bibitem[{Doležal et~al.(2019)}]{Doležal:19:Charge}
Doležal, J., Merino, P., Redondo, J., Ondič, L., Cahlík, A., Švec, M., Charge Carrier Injection Electroluminescence with CO-Functionalized Tips on Single Molecular Emitters. {\it Nano Lett.} {\bf 19}(12): 8605--8611, 2019.

\bibitem[{Lüpke et~al.(2019)}]{Lüpke:19:Surface}
Lüpke, F., Doležal, J., Cherepanov, V., Ošťádal, I., Stefan Tautz, F., Voigtländer, B., Surface structures of tellurium on Si(111)–(7×7) studied by low-energy electron diffraction and scanning tunneling microscopy. {\it Surf. Sci.} {\bf 681}(Mar): 130--133, 2019.

\bibitem[{Lüpke et~al.(2017)}]{Lüpke:17:Chalcogenide-based}
Lüpke, F., Just, S., Bihlmayer, G., Lanius, M., Luysberg, M., Doležal, J., Neumann, E., Cherepanov, V., Ošťádal, I., Mussler, G., Grützmacher, D., Voigtländer, B., Chalcogenide-based van der Waals epitaxy: Interface conductivity of tellurium on Si(111). {\it Phys. Rev. B.} {\bf 96}(3): 035301, 2017.