Study of doping of sapphire layers using atomic force microscopy

Supervisor: Doc. RNDr. Pavel Kocán, Ph.D.
Status: Available

Abstract:
Sapphire doped with heavy metal ions has applications as a laser usable in extreme conditions. The main goal will be to use the qPlus sensor to study the incorporation of doping ions into the sapphire crystal matrix at the atomic level. As part of the European Innovation Council (EIC) Pathfinder project, the work will study the morphology of doped sapphire prepared by pulsed laser deposition, and especially the distribution of these ions in the sapphire lattice. The main technique will be atomic force microscopy (AFM) under ultra-high vacuum (UHV) with the possibility of atomic resolution. The work will be carried out in cooperation with members of the European project consortium. In case of interest, please contact pavel.kocan@matfyz.cuni.cz